Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

X-ray Imaging

Abstract

Quantitative Density Analysis of Ultra-Low Density Polymer Foams Using Various X-ray Imaging Techniques

Fluorescence Micro-tomography of Frozen-hydrated Whole Cells using the Bionanoprobe

X-ray Mapping Investigations of the Monazites from the Mt Weld Deposit - Compositional Variance as an Indicator of Provenance

In-situ Compression Imaging of Polymer Foams using Synchrotron X-ray Computed Tomography

The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

X-ray Quantitative Microanalysis Maps across Interfaces of a Cu-Al Roll Bonded Laminate with an Annular Silicon Drift Detector

X-ray Mapping and Chemical Phase Mapping with an Amptek SDD

Frontiers of Electron-Probe Microanalysis

Abstract

Analytical Challenges and Strategies in FE-EPMA

Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM

Recent Achievements of Electron Beam Deceleration Method for FE-SEM Enhanced Elemental Analysis including Soft X-ray Emission Spectroscopy

Strategies for Low Accelerating Voltage X-ray Microanalysis of Sub-Micrometer Features with the FE-EPMA

Progress towards Accurate Quantitative Standardless X-ray Analysis at Low kV

Comparative Performance of SDD-EDS and WDS Detectors for Quantitative Analysis of Mineral Specimens: The Next Generation Electron Microprobe

Comparison of SEM-EDS and EPMA-WDS Analysis of Rare Earth Element Containing Minerals from Bokan Mountain, Alaska

Standardless Analysis - Better but Still Risky

Soft X-Ray EPMA Analyses of Extremely Reduced Phases from Apollo 16 Regolith: Problems and Solutions for Sub-Micron Analysis

Towards Reliable Quantification of Steel Alloys at Low Voltage

Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

X-ray Imaging

Abstract

Frontiers of Electron-Probe Microanalysis

Abstract