Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers of Electron-Probe Microanalysis

Abstract

Quantitative Analysis Using Asymmetric Adaptive Pulse Processing

Application of Monte Carlo Calculations to Improve Quantitative Electron Probe Microanalysis

Compositional Mapping by EPMA and µXRF

Spectrum-based Phase Mapping of Apatite and Zoned Monazite Grains Using Principal Component Analysis

Using Electron-Probe Microanalysis and Quantitative Compositional Mapping to Study Lithic Clasts in Lunar Meteorites NWA 2727 and NWA 3170

Interdisciplinary X-Ray Microanalysis: From Planets and Comets to Artifacts and Fine Art

Determination of Trace Elements in Quartz by Combined EPMA and CL Microspectrometry

Trace Element Analyses by EMP: Pb-in-Monazite and New Multipoint Background Method

Quantitative Electron-probe Microanalysis and WDS Background Measurement

A New EPMA Method For Fast Trace Element Analysis In Simple Matrices

What's Still Missing with the Fluorescence Corrections and Should We Care?

FEG-EPMA of Solid State Redox Sensors - the Effect of Secondary Fluorescence on Analytical Precision

Determination of the k-Values of Copper-Gold Alloys with ED- and WD-EPMA - Results of an Inter-Laboratory Comparison

EPMA WDS Quality Assurance: Materials and Methods

Low Energy Microanalysis by EDS or WDS? Comparisons and Concerns from an Analytical Services Laboratory Perspective

Analytical Multilayer Model Revisited for High Atomic Numbers at Low Voltage

Quantitative Microanalysis at Low Voltage with a WDS Electron Microprobe Equipped with a FE Column

Mitigating Thermal Beam Damage with Metallic Coats in Low Voltage FEG-EPMA of Geological Materials

Development of an Automated Phase Analysis Procedure for Multi-Component Samples in EPMA

Overcoming Quantitative Challenges Presented By X-Ray Line Interferences in EDS and WDS

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

Frontiers of Electron-Probe Microanalysis

Abstract