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Standardless Analysis - Better but Still Risky

Published online by Cambridge University Press:  27 August 2014

Nicholas W. M. Ritchie  and
Dale E. Newbury
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Material Measurement Science Division, Gaithersburg, MD 20899-8371
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Material Measurement Science Division, Gaithersburg, MD 20899-8371

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 696 - 697
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Newbury, D. E., Swyt, C. R. , and Myklebust, R. L. "'Standardless' Quantitative Electron ProbeMicroanalysis with Energy-Dispersive X-ray Spectrometry: Is It Worth the Risk?", Analytical Chemistry, 67 (1995) 1866-1871.Google Scholar
[2] Ritchie, N “Standards-based Quantification in DTSA-II - Part I”, Microscopy Today, Sept. (2011) 30-36 NIST DTSA-II is freely available from http://www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html.Google Scholar