Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Statham, P
Penman, C
and
Duncumb, P
2016.
Improved spectrum simulation for validating SEM-EDS analysis.
IOP Conference Series: Materials Science and Engineering,
Vol. 109,
Issue. ,
p.
012016.
Pinard, P T
and
Richter, S
2016.
Quantification of low concentration elements using soft X-rays at high spatial resolution.
IOP Conference Series: Materials Science and Engineering,
Vol. 109,
Issue. ,
p.
012013.
Pinard, Philippe
Burgess, Simon
Protheroe, Alan
Jones, Rosie
and
Statham, Peter
2020.
Practical Aspects for Reliable Standardless Quantification in Energy Dispersive X-ray Spectrometry.
Microscopy and Microanalysis,
Vol. 26,
Issue. S2,
p.
1554.
Pinard, P T
Protheroe, A
Holland, J
Burgess, S
and
Statham, P J
2020.
Development and validation of standardless and standards-based X-ray microanalysis.
IOP Conference Series: Materials Science and Engineering,
Vol. 891,
Issue. 1,
p.
012020.