Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Richter, Silvia
and
Pinard, Philippe T.
2015.
Multi-beam energy acquisition in FE-EPMA.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1441.
Llovet, Xavier
Pinard, Philippe T.
Heikinheimo, Erkki
Louhenkilpi, Seppo
and
Richter, Silvia
2016.
Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines.
Microscopy and Microanalysis,
Vol. 22,
Issue. 6,
p.
1233.
Heikinheimo, E.
Pinard, P.T.
Richter, S.
Llovet, X.
and
Louhenkilpi, S.
2016.
Electron probe microanalysis of Ni-silicides at low voltage: difficulties and possibilities.
IOP Conference Series: Materials Science and Engineering,
Vol. 109,
Issue. ,
p.
012005.
Pinard, P T
and
Richter, S
2016.
Quantification of low concentration elements using soft X-rays at high spatial resolution.
IOP Conference Series: Materials Science and Engineering,
Vol. 109,
Issue. ,
p.
012013.