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Soft X-Ray EPMA Analyses of Extremely Reduced Phases from Apollo 16 Regolith: Problems and Solutions for Sub-Micron Analysis

Published online by Cambridge University Press:  27 August 2014

P. Gopon ,
J. Fournelle ,
P. Sobol ,
M. Spicuzza ,
P. Pinard ,
S. Richter ,
X. Llovet  and
J.W. Valley
P. Gopon
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
J. Fournelle
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
P. Sobol
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
M. Spicuzza
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA
P. Pinard
Affiliation:
Gemeinschaftslabor für Electronenmikroskopie, RWTH 52074 Aachen, Germany
S. Richter
Affiliation:
Gemeinschaftslabor für Electronenmikroskopie, RWTH 52074 Aachen, Germany
X. Llovet
Affiliation:
CCiTUB, University of Barcelona, ES-08028 Barcelona, Spain
J.W. Valley
Affiliation:
Dept. of Geoscience, University of Wisconsin, Madison, Wisconsin 53706USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 698 - 699
Copyright
Copyright © Microscopy Society of America 2014 

References

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