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The Use of a High-Resolution, High-Contrast X-ray Microscope to Probe the Internal Structure of Low Z Materials

Published online by Cambridge University Press:  27 August 2014

Joseph D. Ferrara ,
Yoichi Araki ,
Kensaku Hamada ,
Kazuhiko Omote  and
Yoshihiro Takeda
Joseph D. Ferrara
Affiliation:
Rigaku Americas Corporation, X-ray Research Laboratory, The Woodlands, Texas, USA
Yoichi Araki
Affiliation:
Rigaku Corporation, X-ray Research Laboratory, Akishima-shi, Tokyo, Japan
Kensaku Hamada
Affiliation:
Rigaku Corporation, X-ray Research Laboratory, Akishima-shi, Tokyo, Japan
Kazuhiko Omote
Affiliation:
Rigaku Corporation, X-ray Research Laboratory, Akishima-shi, Tokyo, Japan
Yoshihiro Takeda
Affiliation:
Rigaku Corporation, X-ray Research Laboratory, Akishima-shi, Tokyo, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 674 - 675
Copyright
Copyright © Microscopy Society of America 2014