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Quantitative X-ray Microanalysis of Low Atomic Number Elements by SEM/SDD-EDS with NIST DTSA II: Carbides and Nitrides and Oxides, Oh My!

Published online by Cambridge University Press:  27 August 2014

Dale E. Newbury  and
Nicholas W. M. Ritchie

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 702 - 703
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Goldstein, J., et al., Scanning Electron Microscopy and X-ray Microanalysis, 3rd ed. (Springer, New York (2003) 391.Google Scholar
[2] Bastin, G.and Heijligers, H. in Electron Probe Quantitation, K Heinrich and D. Newbury, eds. (Plenum, New York (1991)163-175.Google Scholar
[3] Ritchie, N., Newbury, D., and Davis, J.Microsc. Microanal., 182012) 892.Google Scholar
[4] Ritchie, N. DTSA-II available free at:www.cstl.nist.gov/div837/837.02/epq/dtsa2/index.html.Google Scholar