Microscopy and Microanalysis: Volume 20 - Proceedings of Microscopy & Microanalysis 2014

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract

TFS: Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Optimization of the Data Acquisition and Processing using a Prior Knowledge of the Camera Characteristics: an EFTEM Case Study

Monte Carlo Simulation and Experimental High-Angle Annular Dark Field Tomography

The Phantom in the Noise and Validation of 3D EM Reconstructions

Advanced 3-D Reconstruction Algorithms for Electron Tomography

Compressed Sensing, Sparsity, and the Reliability of Tomographic Reconstructions

3D EDS Applications Using Destructive and Non-Destructive FIB-Based Techniques

Time-Resolved 3D Imaging of Ion Beam Induced Surface Damage in Gold Nanoparticles

Model-based Iterative Reconstruction for Low-dose Electron Tomography

Atomic Resolution Tomography of Magnetically Anisotropic FePt Nanoparticles

Electron Diffraction Based Tilt Angle Measurements in Electron Tomography

A Model Based Method for Tomographic Reconstructions of Nanoparticle Assemblies

Energy-Filtered Transmission Electron Microscope Tomography of Silicon Nanoparticles in Silicon Dioxide Deposited with High Density Plasma Chemical Vapor Deposition

Data Intensive Imaging for 3D Atom Probe

Compositional Analysis of as-cast and Crystallized Pd43Cu27Ni10P20 Bulk Metallic Glass

Multi-scale 3D mapping of Tomography Data

X-ray Tomography and Finite Elements Simulations of Rock Mechanics

Fusing Multi-scale and Multi-modal 3D Imaging and Characterization

Tracing Tubular Objects in 3D Confocal Images Using Haptic Device

Digital Darkfield Analysis of Lattice Fringe Images with ImageJ

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2014

Advances in Instrumentation Symposia

3D Imaging and Microanalysis: Image Analysis and Applications

Abstract