Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

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Microscopy and Microanalysis 2002: Presidents

Abstract

The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Junctions from Electron Holograms

Foreword

Letter from the Retiring Editor

Comparison of Fib Tem Specimen Preparation Methods

Looking at Prion Diseases in situ with Infrared Microscopy

Focused Ion Beam Based Sample Preparation Techniques

A Newly Developed Fib System For Tem Specimen Preparation

FIB Damage in Silicon: Amorphization or Redeposition?

Gallium Phase Formation in Cu and Other FCC Metals During Near-Normal Incidence Ga-FIB Milling and Techniques to Avoid this Phenomenon

Other

Microbeam Analysis Society

Abstract

Focused Ion Beam: Much More Than a Sample Preparation Tool

Dual-beam Focused Ion Beam: A Multifunctional Tool for Nanotechnology

Other

Microscopical Society of Canada Soci�t� De Microscopie Du Canada

Abstract

The DualBeam FIB in a Materials Science Laboratory

Analysis of Bone Utilizing Infrared and Raman Chemical Imaging

Advances in Dual Beam TEM Sample Preparation

Other

Microscopy and Microanalysis 2002: Program Committee

Committee Members and Session Chairs

Abstract

Probing the Electronic Structure of Transition Metal Oxides using Electron Energy-Loss Spectroscopy

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

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