Microscopy and Microanalysis: Volume 8 - Issue S02

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract

Structures and Energetics of Interfaces in Materials – Ab-initio Local-Density-Functional Theory –

Electron Energy-Loss Spectroscopy of Alternative Gate Dielectric Stacks

Development of An 0.2eV Energy Resolution Analytical Electron Microscope

Monochromized 200kV (S)TEM

EFTEM at High Magnification: Principles and Practical Applications

Understanding DNA Organization in the Nucleus By Fluorescence Microscopy and Energy Filtered Transmission Electron Microscopy

X-ray Spectrometry In The Fast Lane: An Introduction To High Speed Digital Processing Techniques And Their Application To Emerging EDS Technologies

The Development of Microcalorimeter EDS Arrays

The Latest Experiences Using A Cryogen Free Microcalorimeter Energy Dispersive X-Ray Spectrometer

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

Real Time Color Scans with Scanning Electron Microscopes – A New Application of the XFlash® X-ray Detector Technology

Exploring the Valence Electron Distribution in High Temperature Superconductors with a Focused Electron Probe

Refinement of Crystal Structural Parameters and Charge Density using Convergent-Beam Electron Diffraction

Quantitative Convergent Beam Electron Diffraction

Bloch Wave Degeneracies and Critical Voltage Effects in CBED patterns

How to Select the Items for the Shopping List of Future High Resolution Electron Microscopists?

The 3D structure of a complex quasicrystal approximant determined by electron crystallography

HRTEM Resolution Extension for Interface by Gerchberg-Saxton Algorithm with Supported Constraint

The collection of electron diffraction intensity data and their use in structure determination

The Accuracy of Crystal Structure Refinement from Electron Diffraction Data using Parallel Beam Illumination

Microscopy and Microanalysis

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Volume 8 - Issue S02 - August 2002

Abstract