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The Determination and Interpretation of Electrically Active Charge Density Profiles at Reverse Biased p-n Junctions from Electron Holograms

Published online by Cambridge University Press:  01 August 2002

R.E. Dunin-Borkowski ,
A.C. Twitchett  and
P.A. Midgley
R.E. Dunin-Borkowski
Affiliation:
Dept of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, UK
A.C. Twitchett
Affiliation:
Dept of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, UK
P.A. Midgley
Affiliation:
Dept of Materials Science and Metallurgy, University of Cambridge, Cambridge CB2 3QZ, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 42 - 43
Copyright
Copyright © Microscopy Society of America 2002