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Focused Ion Beam Based Sample Preparation Techniques

Published online by Cambridge University Press:  01 November 2002

R. M. Langford ,
A. K. Petford-Long  and
P. Gnauck
R. M. Langford
Affiliation:
Department of Materials, University of Oxford, United Kingdom, OX1 3PH
A. K. Petford-Long
Affiliation:
Department of Materials, University of Oxford, United Kingdom, OX1 3PH
P. Gnauck
Affiliation:
LEO Elektronenmikroskopie GmbH, Oberkochen, Germany

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 46 - 47
Copyright
Copyright © Microscopy Society of America 2002