Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T13:13:14.506Z Has data issue: false hasContentIssue false
  • English
  • Français

Focused Ion Beam: Much More Than a Sample Preparation Tool

Published online by Cambridge University Press:  01 August 2002

P.E. Russell ,
T.J. Stark ,
J.P. Viterelli ,
A.R. Guichard ,
J. Wang ,
K. L. Bunker ,
J.C. Gonzalez  and
D.P. Griffis
P.E. Russell
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
T.J. Stark
Affiliation:
Materials Analytical Services, Raleigh, NC 27606
J.P. Viterelli
Affiliation:
Materials Analytical Services, Raleigh, NC 27606
A.R. Guichard
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
J. Wang
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
K. L. Bunker
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
J.C. Gonzalez
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531
D.P. Griffis
Affiliation:
Analytical Instrumentation Facility, North Carolina State University, Raleigh, NC 27502-7531

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 54 - 55
Copyright
Copyright © Microscopy Society of America 2002