Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances in Programming of Quantitative Microscopy for Biological and Materials Science

Abstract

Detection of Protein Secondary Structure Patterns from 3D Cryo-TEM Maps at Medium Resolution - Combining the Best of SSETracer and VolTrac

Gesture-Based Control of ImageJ Using Leap Sensors

The Dragonfly Macro Engine for Executing Recorded Tasks in Image Processing and Visualization

Eye Gaze Pattern Analysis of Whole Slide Image Viewing Behavior in PathEdEx Platform

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract

Site Specific Cryo-FIB Preparations Aimed at in situ Cryo-Electron Tomography

Multi-modal SEM/FIB-SEM for Precise Targeting of Cell-Cell Junctions in Human Pancreatic Islets.

3D Microanalysis of Porous Copper Using FIB-Tomography in Combination with X-ray Computed Tomography

Potential of Application Focused Ion Beam in Forensic Science Area

In-situ TEM Analyses over FIB Lamellae - Investigating High Temperature Conversion of Solution Processed Mo-precursor to MoS2 Semiconductor Films.

Building with Ions in the Helium Ion Microscope

Nanofabrication Limits in Layered Ferroelectric Semiconductors via He-ion Beam

Rapid Screening of Nanoporous Structures in SiO2 Catalyst Particles via Helium Ion Microscopy

A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam

Targeted Ion Milling of Ex Situ Lift-Out FIB Specimens

A Comparison of Current and Emerging Ion and Laser Beam Techniques for High Throughput Material Removal

Improvements in Characterization of FIB Prepared Surfaces of Aluminum Using Xe+ Plasma FIB

Comparison of Characteristics of Neon, Argon, and Krypton Ion Emissions from Gas Field Ionization Source with Single Atom Tip

Cold-Atom Ion Sources for Focused Ion Beam Applications

HIM-SIMS: Correlative SE/Chemical Imaging at the Limits of Resolution.

Sample Preparation for Nano-mechanical Testing on Radioactive Materials

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Advances in Programming of Quantitative Microscopy for Biological and Materials Science

Abstract

Advances in FIB Instrumentation and Applications in Materials and Biological Sciences

Abstract