Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-26T13:55:27.422Z Has data issue: false hasContentIssue false
  • English
  • Français

Potential of Application Focused Ion Beam in Forensic Science Area

Published online by Cambridge University Press:  04 August 2017

Marek Kotrly
Marek Kotrly*
Affiliation:
Institute of Criminalistics Prague (ICP), Czech Republic; Charles University in Prague, Faculty of Science, Praha, Czech Republic.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 256 - 257
Copyright
© Microscopy Society of America 2017 

References

[1] Kotrly, M., Mares, B., Turkova, I. & Beroun, I. Proc. SPIE 9823, (2016), p. 98230S-1 - 9.Google Scholar
[2] Kotrly, M. & Turkova, I. Proc. SPIE 9486, 2015, Vol. 9486, (2015), p. 948614-1 - 11.Google Scholar
[3] Kotrly, M. Microsc. Microanal 22(Suppl 3 2016). p. 2032.Google Scholar
[4] Acknowledgements - Microanalytical methods at ICP has been supported by the projects of the Ministry of the Interior of the Czech Republic: VG20102015065, VF20112015016, VI20152020004, VI20152020035, VI20172020050.Google Scholar