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HIM-SIMS: Correlative SE/Chemical Imaging at the Limits of Resolution.

Published online by Cambridge University Press:  04 August 2017

D. Dowsett ,
T. Wirtz  and
L. Yedra
D. Dowsett
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
T. Wirtz
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg
L. Yedra
Affiliation:
Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 278 - 279
Copyright
© Microscopy Society of America 2017 

References

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