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Comparison of Characteristics of Neon, Argon, and Krypton Ion Emissions from Gas Field Ionization Source with Single Atom Tip

Published online by Cambridge University Press:  04 August 2017

Hiroyasu Shichi ,
Shinichi Matsubara  and
Tomihiro Hashizume
Hiroyasu Shichi
Affiliation:
Research & Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
Shinichi Matsubara
Affiliation:
Research & Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
Tomihiro Hashizume
Affiliation:
Research & Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 274 - 275
Copyright
© Microscopy Society of America 2017 

References

[1] Ward, B. W., Notte, John A. & Economou, N. P. J. Vac. Sci. Technol. 24 2006). p. 2871.Google Scholar
[2] Rezeq, M., Pitters, J. & Wolkow, R. J. Chem. Phys. 124 2006). p. 204716.Google Scholar
[3] We thank Dr. Y. Sugiyama and Mr. Y. Kawanami of Hitachi High-Tech Science Corporation for our valuable discussions. This research was supported by Hitachi High-Tech Science Corporation.Google Scholar