Microscopy and Microanalysis: Volume 23 - Proceedings of Microscopy & Microanalysis 2017

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Big, Deep, and Smart Data in Microscopy

Abstract

Computational Methods for Large Scale Scanning Transmission Electron Microscopy (STEM) Experiments and Simulations

Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images

Less is More: Bigger Data from Compressive Measurements

Acquisition and Fast Analysis of Multi-Dimensional STEM Data

Reconstruction of Randomly and Partially Sampled STEM Spectrum-Images

Robust Nanostructure from High Throughput Powder Diffraction Data

Statistical Analyses of Electron Nanodiffraction Patterns to Examine Order and Structural Variability in Amorphous Materials

Multivariate Statistical Analysis of a Multimodal Diffraction and X-ray Spectral Series Data Set

Leveraging First Principles Modeling and Machine Learning for Microscopy Data Inversion

Accurate Diffraction Peak Identification for Scanning Electron Nanodiffraction Based on Automated Image Processing and Feature Detection

Autonomous Experimentation Applied to Carbon Nanotube Synthesis

G-mode - Full Information Capture Applied to Scanning Probe Microscopy

Combinatorial Microscopy in Liquids with Low Energy Electrons

Physics-Based Image Reconstruction of SiC Grain Boundaries

What Can We Learn from the Shapes of Secondary Electron Puddles on Direct Electron Detectors?

Rapid Measurement of I-V Curves via Complete Information Acquisition

Separation of Hard to Distinguish Phases in Automated Feature Analysis

Understanding and Exploiting the Interaction of Electron Beams With Low-dimensional Materials - From Controlled Atomic-level Manipulation to Circumventing Radiation Damage

Supervised Component Analysis for EELS Mapping

Processing a Five Dimensional X-ray Image: Big Data Challenges and Opportunities

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2017

Analytical and Instrumentation Science Symposia

Big, Deep, and Smart Data in Microscopy

Abstract