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A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam

Published online by Cambridge University Press:  04 August 2017

Lan-Hsuan Lee ,
Chia-Hao Yu ,
Yu-Ting Hong  and
Cheng-Yen Wen
Lan-Hsuan Lee
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Chia-Hao Yu
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Yu-Ting Hong
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Cheng-Yen Wen
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 266 - 267
Copyright
© Microscopy Society of America 2017 

References

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[7] The authors acknowledge funding from the Ministry of Science and Technology of Taiwan, Grant No. MOST 103-2112-M-002-015-MY3..Google Scholar