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A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam

Published online by Cambridge University Press:  04 August 2017

Lan-Hsuan Lee ,
Chia-Hao Yu ,
Yu-Ting Hong  and
Cheng-Yen Wen
Lan-Hsuan Lee
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Chia-Hao Yu
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Yu-Ting Hong
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
Cheng-Yen Wen
Affiliation:
Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 266 - 267
Copyright
© Microscopy Society of America 2017 

References

[1] Mayer, J, et al, MRS Bull. 32 2007). p. 400.CrossRefGoogle Scholar
[2] Langford, R M, et al, J. Vac. Sci. Technol., B 19 2001). p. 755.Google Scholar
[3] Floresca, H C, et al, Microsc. Microanal. 15 2009). p. 558.CrossRefGoogle Scholar
[4] Kim, J S, et al, Appl. Microsc. 45 2015). p. 195.Google Scholar
[5] O'Shea, K J, et al, Micron 66 2014). p. 9.CrossRefGoogle Scholar
[6] Jublot, M & Texier, M Micron 56 2014). p. 63.Google Scholar
[7] The authors acknowledge funding from the Ministry of Science and Technology of Taiwan, Grant No. MOST 103-2112-M-002-015-MY3..Google Scholar