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Thermal stability of carbon nitride thin films
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- 31 January 2011, pp. 3188-3201
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Characterization of bond formation in SiC and Si3N4 implanted with Ti, Fe, and Co
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- 31 January 2011, pp. 512-523
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Rheological characteristics of slurry controlling the microstructure and the compressive strength behavior of biomimetic hydroxyapatite
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- 31 January 2011, pp. 163-170
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Dielectric properties of La-substituted Pb0.5Ca0.5[(Mg1/3Nb2/3)0.5Ti0.5]O3 ceramics
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- 31 January 2011, pp. 2053-2056
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Alternative technique for analyzing instrumented indentation data
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- 31 January 2011, pp. 3202-3206
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Structures and microwave dielectric properties of Ba6−3x(Nd,Biy)8+2xTi18O54 (x = 2/3) solid solution
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- 31 January 2011, pp. 1734-1738
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Thin-film fracture during nanoindentation of a titanium oxide film–titanium system
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- 31 January 2011, pp. 2634-2643
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Subsolidus phase relations in the La2O3–Fe2O3–Al2O3 system
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- 26 November 2012, pp. 822-827
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Solid-state reaction mechanism for the formation of Ba6−xLn8+2 x/3Ti18O54 (Ln = Nd, Sm) solid solutions
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- 31 January 2011, pp. 2350-2356
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Carrier diffusion characterization in epitaxial 4H–SiC
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- 31 January 2011, pp. 524-528
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Delamination of a strong film from a ductile substrate during indentation unloading
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- 31 January 2011, pp. 1396-1407
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Preparation of calcium strontium hydroxyapatites by a new route involving calcium phosphate cements
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- 31 January 2011, pp. 171-178
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Crystallization and dielectric properties of SrO–BaO–Nb2O5–GeO2 tungsten–bronze glass–ceramics
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- 31 January 2011, pp. 2057-2063
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Effects of zinc(II) and iron(III) doping of titania films on their photoreactivity to decompose rhodamine B
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- 31 January 2011, pp. 2928-2933
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Finite element modeling of microscale thermal residual stresses in Al interconnects
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- 31 January 2011, pp. 1112-1122
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Impacts of postannealing ambient atmospheres on Pt/SrBi2.2Ta2O9/Pt capacitors
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- 31 January 2011, pp. 3526-3535
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Directional solidification and microstructural studies of the peritectic Y2BaCuO5 phase
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- 31 January 2011, pp. 1123-1134
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Effect of lead content on vibration fracture behavior of Pb–Sn eutectic solder
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- 31 January 2011, pp. 2644-2652
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Growth of (111)-oriented Pb(Zr,Ti)O3 layers on nanocrystalline RuO2 electrodes using the sol-gel technique
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- 26 November 2012, pp. 828-833
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Effect of annealing on microstructure, residual stress, and hardness of Al–Ti multilayered films
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- 31 January 2011, pp. 2064-2076
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