23 results
Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2178-2180
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- August 2022
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Lossless Image Compression for 4D-STEM Datasets
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3060-3061
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- August 2022
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Contrast Mechanisms in Secondary Electron e-Beam-Induced Current (SEEBIC) Imaging
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- Microscopy and Microanalysis / Volume 28 / Issue 5 / October 2022
- Published online by Cambridge University Press:
- 30 May 2022, pp. 1567-1583
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- October 2022
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Atomic-scale Feedback-controlled Electron Beam Fabrication of 2D Materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 3072-3073
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- August 2021
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Electron Beam Control of Dopants in 2D and 3D Materials
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2150-2153
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- August 2021
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Super-Graphene: The Role of Temperature on Radiation Resistance
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2360-2361
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- August 2020
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Imaging Conductivity in a Single Atomic Layer
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1704-1705
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- August 2020
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Accurately Imaging, Tracking and Moving Single Atoms
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 2556-2557
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- August 2020
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Causal Learning from Structural and Spectral Electron Microscopy Data
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 28 July 2020, p. 6
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- August 2020
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Unsupervised Machine Learning to Distill Structural-Property Insights from 4D-STEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 12-13
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- August 2019
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From Control of the Electron Beam to Control of Single Atoms
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1678-1679
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- August 2019
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Towards Atomic Scale Quantum Structure Fabrication in 2D Materials
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 940-941
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- August 2019
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A STEM-based Path Towards Atomic-scale Silicon-based Devices
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2290-2291
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- August 2019
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Lab on a beam—Big data and artificial intelligence in scanning transmission electron microscopy
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- MRS Bulletin / Volume 44 / Issue 7 / July 2019
- Published online by Cambridge University Press:
- 12 July 2019, pp. 565-575
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- July 2019
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Towards Atomic-Scale Fabrication in Silicon
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 158-159
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- August 2018
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Atomic Manipulation on a Scanning Transmission Electron Microscope Platform using Real-Time Image Processing and Feedback
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 534-535
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- August 2018
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Automated Atom-by-Atom Assembly of Structures in Graphene: The Rise of STEM for Atomic Scale Control
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1594-1595
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- August 2018
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Using Multivariate Analysis of Scanning-Rochigram Data to Reveal Material Functionality
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 292-293
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- July 2016
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Fast Aberration Measurement in Multi-Dimensional STEM
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 252-253
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- July 2016
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Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 900-901
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- July 2016
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