Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T19:54:39.713Z Has data issue: false hasContentIssue false

Electron Beam Control of Dopants in 2D and 3D Materials

Published online by Cambridge University Press:  30 July 2021

Andrew R. Lupini
Affiliation:
Oak Ridge National Laboratory, United States
Bethany Hudak
Affiliation:
U.S. Naval Research Laboratory, District of Columbia, United States
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, United States
Jiaming Song
Affiliation:
School of Physics, Northwest University, Xi'an, China, United States
Ondrej Dyck
Affiliation:
Oak Ridge National Laboratory, United States
Paul Snijders
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, United States
Sergei Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Defects in Materials: How We See and Understand Them
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Krivanek, O.L et al. , Nature 464 (2010) 571-574CrossRefGoogle Scholar
Dyck, O. et al. , Ultramicroscopy 211 (2020) 112949Google Scholar
Dyck, O. et al. , Applied Physics Letters 111 (2017) 113104CrossRefGoogle Scholar
Susi, T et al. , Ultramicroscopy 180 (2017) 163CrossRefGoogle Scholar
Ishikawa, R. et al. , Phys Rev Lett 113 (15) (2014) 15550Google Scholar
Hudak, B.M. et al. , ACS Nano 12 (2018) 5873CrossRefGoogle Scholar
Ishikawa, R., et al. , Phys Rev Applied 13 (2020) 034064Google Scholar
Ophus, C., Microscopy and Microanalysis 25 (2019) 563-582Google Scholar
Pennycook, T.J. et al. , Ultramicroscopy 151 (2015) 160-167CrossRefGoogle Scholar
Lupini, A.R., Chi, M., Jesse, S., Journal of Microscopy 263 (2016) 43-50CrossRefGoogle Scholar
Dyck, O., et al. , Small Methods, (2021) 2000950Google Scholar
Oxley, M.P., et al. , Mach. Learn.: Sci. Technol. 1 (2020) 04LT01Google Scholar
Work supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Division of Materials Science and Engineering, and sample growth by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC for the U.S. Department of Energy, and was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy Office of Science User Facility.Google Scholar