Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-22T16:03:16.549Z Has data issue: false hasContentIssue false
  • English
  • Français

Causal Learning from Structural and Spectral Electron Microscopy Data

Published online by Cambridge University Press:  28 July 2020

Sergei Kalinin ,
Rama Vasudevan ,
Christopher Nelson ,
Ondrej Dyck ,
Stephen Jesse ,
Andrew Lupini  and
Maxim Ziatdinov
Sergei Kalinin
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Rama Vasudevan
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Christopher Nelson
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Ondrej Dyck
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Stephen Jesse
Affiliation:
Oak Ridge National Laboratory, NA, Alabama, United States
Andrew Lupini
Affiliation:
Oak Ridge National Laboratory Stephen Jesse, Knoxville, Tennessee, United States
Maxim Ziatdinov
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 6
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

This research is supported by the by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division and the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, BES DOE.Google Scholar