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Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control
Published online by Cambridge University Press: 22 July 2022
Abstract
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- Type
- Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
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- Copyright
- Copyright © Microscopy Society of America 2022
References
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Microscopy research was performed at the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory, which is a US Department of Energy (DOE), Office of Science User Facility. This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).Google Scholar
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