Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-27T07:38:48.411Z Has data issue: false hasContentIssue false
  • English
  • Français

Fast Aberration Measurement in Multi-Dimensional STEM

Published online by Cambridge University Press:  25 July 2016

Andrew R. Lupini ,
Miaofang Chi ,
Sergei V. Kalinin ,
Albina Y. Borisevich ,
Juan Carlos Idrobo  and
Stephen Jesse
Andrew R. Lupini
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Miaofang Chi
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Albina Y. Borisevich
Affiliation:
Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Juan Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 252 - 253
Copyright
© Microscopy Society of America 2016 

References

[1] Krivanek, O.L., Dellby, N. & Lupini, A.R. Ultramicroscopy 78 (1999) 1–11.Google Scholar
[2] Pennycook, T.J., et al, Ultramicroscopy, Ultramicroscopy 151 (2015) 160–167.CrossRefGoogle Scholar
[3] Rodenburg, J. M., McCallum, B. C. & Nellist, P. D. Ultramicroscopy 48 (1993). p. 304.CrossRefGoogle Scholar
[4] Sawada, H., et al., Ultramicroscopy 108(11), 1467–1475.CrossRefGoogle Scholar
[5] Lupini, A.R., Chi, M. & Jesse, S. Journal of Microscopy (2016) DOI: 10.1111/jmi.12372.Google Scholar
[6] Research supported by Division of Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. DOE (ARL, AYB) and by Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (MC, SVK, JCI, SJ).Google Scholar