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Atomic Manipulation on a Scanning Transmission Electron Microscope Platform using Real-Time Image Processing and Feedback

Published online by Cambridge University Press:  01 August 2018

Ondrej Dyck ,
Songkil Kim ,
Albina Borisevich ,
Bethany M. Hudak ,
Andrew R. Lupini ,
Sergei V. Kalinin  and
Stephen Jesse
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA
Songkil Kim
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA Department of Mechanical Engineering, Pusan National University, Republic of Korea
Albina Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Bethany M. Hudak
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Andrew R. Lupini
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN USA
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 534 - 535
Copyright
© Microscopy Society of America 2018 

References

[1] Dyck, O., Kim, S., Kalinin, S. Jesse, S. Assembling Di-and Multiatomic Si Clusters in Graphene via Electron Beam Manipulation. ARXIV:1710.09416 2017.Google Scholar
[2] Dyck, O., Kim, S., Kalinin, S. Jesse, S. E-beam manipulation of Si atoms on graphene edges with aberration-corrected STEM. ARXIV:1710.10338 2017.Google Scholar
[3] Dyck, O., Kim, S., Kalinin, S. Jesse, S. Mitigating e-beam-induced hydrocarbon deposition on graphene for atomic-scale scanning transmission electron microscopy studies. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B 36 2018.Google Scholar
[4] Dyck, O., Kim, S., Kalinin, S. V. Jesse, S. Placing single atoms in graphene with a scanning transmission electron microscope. APPLIED PHYSICS LETTERS 111 2017.Google Scholar
[5] Kalinin, S. V., Borisevich, A. Jesse, S. Fire up the Atom Forge. NATURE 539 2016.Google Scholar
[6] Jesse, S., et. al. Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision. Small 11 2015.Google Scholar
[7] Research supported by Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy (S.V.K.), and by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy (O.D, S.K., S.J.).Google Scholar