Powder Diffraction: Volume 24 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 24 - December 2009

Contents

Page 11 of 12

Denver X-Ray Conference

F-9 Combined Multiple-Excitation FP Method For Micro-XRF Analysis of Difficult Samples
W.T. Elam, B. Scruggs, J. Nicolosi
Published online by Cambridge University Press:

20 May 2016, p. 170
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F-45 SRM 2855 Additive Elements in Polyethylene WDXRF Analyses and Certification Approach
J.R. Sieber
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20 May 2016, p. 171
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F-43 Oxidic Calibration Using WDXRF-Multiscat®: Applications Shown for Minerals, Ore Concentrates And Slags
S. Bäckman, I. Bernhardsson
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20 May 2016, p. 171
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F-31 Classes of Materials (COM)—A Tool for Analysis and Material Identification
J. Kessler, V. Roßiger, M. Haller
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20 May 2016, p. 171
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F-54 Stardust Cometary Matter Analyzed By Synchrotron Nano-XRF: New Results and Developments
T. Schoonjans, B. Vekemans, G. Silversmit, L. Vincze, S. Schmitz, F. Brenker
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20 May 2016, p. 171
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F-64 L Shell X-ray Fluorescence Cross-Sections for Elements with 33 ≤ Z ≤ 50
V. Sharma, N. Singh, S. Kumar
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20 May 2016, p. 171
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D-15 Invited—Laboratory-Based Characterization of Heteroepitaxial Structures: Advanced Experiments Not Needing Synchrotron Radiation
P. Zaumseil
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20 May 2016, p. 171
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D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures
A. Ulyanenkov, A. Benediktovitch, I. Feranchuk, B. He, H. Ress
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20 May 2016, p. 171
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D-59 Spatially Resolved Determination of Stress in Thin Films and Devices from Curvature Measurements
N. Herres
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20 May 2016, p. 171
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D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material
D. Windover, D.L. Gil, A. Henins, J.P. Cline
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20 May 2016, p. 171
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D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data
A.J. Ying, I.C. Noyan, C.E. Murray
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20 May 2016, p. 171
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D-28 High-Resolution X-ray Scattering Methods for the Structural Characertization of Epitaxial Nitride Structures
J.F. Woitok
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20 May 2016, p. 171
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D-87 Grazing Incidence In-Plane X-ray Diffraction from Epitaxial Fe/MgO/Fe and Fe/Au/MgO/Fe Tunnel Junctions
D.S. Eastwood, M. Abes, B.K. Tanner, T.P.A. Hase, M. Ali, B.J. Hickey
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20 May 2016, p. 171
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D-86 Invited—Structure Solution and Refinement Approaches for Oxide Ceramics
S.T. Misture
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20 May 2016, p. 171
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D-54 Charge-Flipping Structure Solution from Single Crystal and Powder Diffraction Data
A. Kern, A.A. Coelho
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20 May 2016, p. 171
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D-65 Powder Diffraction for Characterization and Development of Oxide Fuels
H.M. Volz, C.R. Stanek, E.P. Luther, J.T. Dunwoody, R.M. Dickerson, K.J. McClellan, S.C. Vogel, D.A. Weldon, D.R. Coughlin, D.D. Byler
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20 May 2016, p. 172
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D-26 Quantitative Analysis of Phases with Partial or No Known Crystal Structure
H. Cordes, A. Kern
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20 May 2016, p. 172
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D-47 Invited—Studying Oxides, Alloys, Gas Hydrates, Borohydrides, and Metal-Organic-Framework Structures Using the Rietveld Method
C.J. Rawn
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20 May 2016, p. 172
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D-90 Addressing the Amorphous Content Issue in Quantitative Phase Analysis: The Certification of NIST SRM 676A
J.P. Cline, J.J. Filliben, R.B. Von Dreele, R. Winburn, P.W. Stephens
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20 May 2016, p. 172
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D-18 Crystal Structures of the Minerals Stichtite and Woodallite Using Rietveld Refinement
P.S. Whitfield, S.A. Wilson, S.J. Mills, G.M. Dipple, M. Raudsepp
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20 May 2016, p. 172
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Page 11 of 12

Powder Diffraction

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Volume 24 - December 2009

Denver X-Ray Conference

F-9 Combined Multiple-Excitation FP Method For Micro-XRF Analysis of Difficult Samples

F-45 SRM 2855 Additive Elements in Polyethylene WDXRF Analyses and Certification Approach

F-43 Oxidic Calibration Using WDXRF-Multiscat®: Applications Shown for Minerals, Ore Concentrates And Slags

F-31 Classes of Materials (COM)—A Tool for Analysis and Material Identification

F-54 Stardust Cometary Matter Analyzed By Synchrotron Nano-XRF: New Results and Developments

F-64 L Shell X-ray Fluorescence Cross-Sections for Elements with 33 ≤ Z ≤ 50

D-15 Invited—Laboratory-Based Characterization of Heteroepitaxial Structures: Advanced Experiments Not Needing Synchrotron Radiation

D-67 High-Resolution X-ray Diffraction Data Analysis From The Partly Relaxed Semiconductor Structures

D-59 Spatially Resolved Determination of Stress in Thin Films and Devices from Curvature Measurements

D-57 NIST SRM 2000—A High Resolution X-ray Diffraction Standard Reference Material

D-89 Invited—Six Ways of Determining Film Thickness from High Resolution XRD Data

D-28 High-Resolution X-ray Scattering Methods for the Structural Characertization of Epitaxial Nitride Structures

D-87 Grazing Incidence In-Plane X-ray Diffraction from Epitaxial Fe/MgO/Fe and Fe/Au/MgO/Fe Tunnel Junctions

D-86 Invited—Structure Solution and Refinement Approaches for Oxide Ceramics

D-54 Charge-Flipping Structure Solution from Single Crystal and Powder Diffraction Data

D-65 Powder Diffraction for Characterization and Development of Oxide Fuels

D-26 Quantitative Analysis of Phases with Partial or No Known Crystal Structure

D-47 Invited—Studying Oxides, Alloys, Gas Hydrates, Borohydrides, and Metal-Organic-Framework Structures Using the Rietveld Method

D-90 Addressing the Amorphous Content Issue in Quantitative Phase Analysis: The Certification of NIST SRM 676A

D-18 Crystal Structures of the Minerals Stichtite and Woodallite Using Rietveld Refinement

Powder Diffraction

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Volume 24 - December 2009

Denver X-Ray Conference