Powder Diffraction: Volume 24 -

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 24 - December 2009

Contents

Page 9 of 12

Denver X-Ray Conference

D-7 Invited—Deformation Mechanisms in Amorphous and Nanocrystalline Metals Meaured by in Situ X-ray Diffraction
R. T. Ott
Published online by Cambridge University Press:

20 May 2016, p. 167
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D-48 Investigation of Surface Structures by Powder Diffraction: A Differential Pair Distribution Function (PDF) Study into Arsenate Sorption on Ferrihydrite
R. Harrington, D. Middlemiss, J. Parise, D. Hausner, D. Strongin, P. Chupas, K. Chapman
Published online by Cambridge University Press:

20 May 2016, p. 167
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D-80 In-Situ Observation of Dynamic Recrystallization and Related Phenomena in the Bulk of Zirconium Alloy
K. -D. Liss, U. Garbe, H. Li, K. Yan, T. Schambron, J. Almer
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20 May 2016, p. 167
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D-75 Measuring and Modeling Deformation Partitioning in Titanium Alloys
M. P. Miller, C. Efstathiou, P. R. Dawson, D. E. Boyce, U. Lienert
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20 May 2016, p. 167
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F-39 Invited—TXRF-XANES and GI-XAS: X-ray Absorption Spectroscopy in Trace Analysis
F. Meirer, C. Streli, P. Wobrauschek, G. Pepponi, D. Giubertoni, P. Pianetta
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20 May 2016, p. 167
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F-60 Portable XRF for FDA Field Investigators: A Review of Some Recent Investigations and Applications
P. E. Baker, R. R. Jacobs, P. T. Palmer
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20 May 2016, p. 168
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F-24 Solving Forensics Mysteries with the XRF Microscope
S. Mamedov, F. Adar, E. Lee, A. Whitley, J. Goldey, G. Setola, Y. Yokota, D. Ward
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20 May 2016, p. 168
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F-27 Water Analysis Using a Prototype Monochromatic Microfocus Grazing Incidence X-ray Fluorescence Device Comparing Picoliter and Nanoliter Deposition as Sample Preparation Approach
U. E. A. Fittschen, G. J. Havrilla
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20 May 2016, p. 168
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F-75 Trace Element Analysis of Micro-XRF by Pinpoint Concentration Method
A. Bando, H. Ono, K. Tsujita, H. Uchihara
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20 May 2016, p. 168
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F-5 Portable Total Reflection X-ray Fluorescence Spectrometer: Comparison Between Non-Monochromatic and Monochromatic X-ray Sources
J. Kawai, Y. Ueda, Y. Morikawa, N. Sasaki, S. Kunimura, T. Yamamoto
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20 May 2016, p. 168
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F-33 Filtered Two Color X-ray Microbeams for Enhancement in Sensitivity of Light Elements
S. Hayakawa, K. Izawa, T. Hirokawa
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20 May 2016, p. 168
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F-48 TXRF Analysis of Multiple Droplet Residues
K. Nakano, M. Kawamata, K. Tsuji
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20 May 2016, p. 168
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F-51 Trace Element Analysis of Dietary Supplements and Nutrients by TXRF
H. Stosnach, A. Buman, M. Rider, A. Seyfarth, J. Neil-Kababick
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20 May 2016, p. 168
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F-56 Depth Analysis with Bench-Top TXRF Instrument
T. Yamada, Y. Shimizu, H. Kobayashi, H. Kohno
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20 May 2016, p. 168
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C-13 Invited—Overview of X-ray Imaging at NSLS-II
Q. Shen
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20 May 2016, p. 168
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C-7 Synchrotron-Based Radioscopy with Spatio-Temporal Micro-Resolution Using Hard X-rays
A. Rack, F. García-Moreno, J. Banhart, O. Betz, S. Zabler, T. Baumbach
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20 May 2016, p. 168
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C-9 Utilization of Synchrotron Radiation in Neurochemical Research
M. Szczerbowska-Boruchowska, J. Chwiej, S. Wójcik, Z. Stęgowski, M. Lankosz, D. Adamek, A. Krygowska-Wajs, B. Tomik, Z. Setkowicz, K. Rickers, D. Zajac, J. Susini
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20 May 2016, p. 168
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F-8 X-rays in 3D
B. M. Patterson, G. J. Havrilla, K. A. Defriend Obrey, J. M. Campbell
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20 May 2016, p. 168
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F-61 Polycapillary Based Confocal Detection Schemes for XRF Micro and Nano-Spectroscopy
B. Vekemans, B. De Samber, T. Schoonjans, G. Silversmit, L. Vincze, R. Evens, K. De Schamphelaere, C. R. Janssen, B. Masschaele, L. Van Hoorebeeke, S. Schmitz, F. Brenker, R. Tucoulou, P. Cloetens, M. Burghammer, J. Susini, C. Riekel
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20 May 2016, p. 169
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D-49 Recent Development of Hard X-ray Transmission Microscopy at the 32ID Beamline at the APS
J. M. Yi, W. -K. Lee, F. De Carlo, Y. S. Chu, W. Yun, Y. Hwu
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20 May 2016, p. 169
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Page 9 of 12

Powder Diffraction

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Volume 24 - December 2009

Denver X-Ray Conference

D-7 Invited—Deformation Mechanisms in Amorphous and Nanocrystalline Metals Meaured by in Situ X-ray Diffraction

D-48 Investigation of Surface Structures by Powder Diffraction: A Differential Pair Distribution Function (PDF) Study into Arsenate Sorption on Ferrihydrite

D-80 In-Situ Observation of Dynamic Recrystallization and Related Phenomena in the Bulk of Zirconium Alloy

D-75 Measuring and Modeling Deformation Partitioning in Titanium Alloys

F-39 Invited—TXRF-XANES and GI-XAS: X-ray Absorption Spectroscopy in Trace Analysis

F-60 Portable XRF for FDA Field Investigators: A Review of Some Recent Investigations and Applications

F-24 Solving Forensics Mysteries with the XRF Microscope

F-27 Water Analysis Using a Prototype Monochromatic Microfocus Grazing Incidence X-ray Fluorescence Device Comparing Picoliter and Nanoliter Deposition as Sample Preparation Approach

F-75 Trace Element Analysis of Micro-XRF by Pinpoint Concentration Method

F-5 Portable Total Reflection X-ray Fluorescence Spectrometer: Comparison Between Non-Monochromatic and Monochromatic X-ray Sources

F-33 Filtered Two Color X-ray Microbeams for Enhancement in Sensitivity of Light Elements

F-48 TXRF Analysis of Multiple Droplet Residues

F-51 Trace Element Analysis of Dietary Supplements and Nutrients by TXRF

F-56 Depth Analysis with Bench-Top TXRF Instrument

C-13 Invited—Overview of X-ray Imaging at NSLS-II

C-7 Synchrotron-Based Radioscopy with Spatio-Temporal Micro-Resolution Using Hard X-rays

C-9 Utilization of Synchrotron Radiation in Neurochemical Research

F-8 X-rays in 3D

F-61 Polycapillary Based Confocal Detection Schemes for XRF Micro and Nano-Spectroscopy

D-49 Recent Development of Hard X-ray Transmission Microscopy at the 32ID Beamline at the APS

Powder Diffraction

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Volume 24 - December 2009

Denver X-Ray Conference