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D-28 High-Resolution X-ray Scattering Methods for the Structural Characertization of Epitaxial Nitride Structures

Published online by Cambridge University Press:  20 May 2016

J.F. Woitok
J.F. Woitok
Affiliation:
PANalytical B. V., Almelo, Netherlands
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 171
Copyright
Copyright © Cambridge University Press 2009

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