Proceedings Paper
How to use and how not to use certified reference materials in industrial chemical metrology laboratories
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- 15 April 2020, pp. 104-111
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Grazing incidence X-ray diffraction measurement of silver nanoparticles in metal-assisted etching of silicon
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- 01 June 2020, pp. 178-184
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Validation of XRD phase quantification using semi-synthetic data
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- 13 October 2020, pp. 262-275
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Proceedings Paper
Laboratory XANES to study vanadium species in vanadium redox flow batteries
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- 29 April 2020, pp. S24-S28
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Technical Article
Certification of Standard Reference Material 660c for powder diffraction
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- 31 January 2020, pp. 17-22
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Proceedings Paper
Bi-cross validation of spectral clustering hyperparameters
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- 24 April 2020, pp. 112-116
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Technical Article
Characterization and Rietveld refinements of new dense ceramics Ba3−xSrxTb3−xCexO9 (x = 1 and 1.5) perovskites
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- 31 January 2020, pp. 23-30
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Synthesis and optical properties of single-crystalline SnS1−xSex nanobelts
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- 04 November 2020, pp. 276-281
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An alternative neutron diffractometer performance for strain/stress measurements
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- 28 May 2020, pp. 185-189
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Proceedings Paper
Refitting an X-ray diffraction system for combined GIXRF and XRR measurements
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- 01 July 2020, pp. S29-S33
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Technical Article
Crystal structure and X-ray absorption spectroscopy of trimethylarsine oxide dihydrate, (CH3)3AsO⋅2H2O
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- 13 July 2020, pp. 190-196
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Proceedings Paper
CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV
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- 05 August 2020, pp. S34-S37
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New Diffraction Data
X-ray powder diffraction data for estra-4,9-diene-3,17-dione, C18H22O2
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- 25 August 2020, pp. 282-285
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Proceedings Paper
A method for mapping submicron-scale crystallographic order/disorder applied to human tooth enamel
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- 08 May 2020, pp. 117-123
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New Diffraction Data
Rietveld refinement of Sm0.55Sr0.45Mn0.4Fe0.6O3
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- 27 March 2020, pp. 31-33
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X-ray powder diffraction data for three new 3-ethylanilinium molybdates
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- 29 April 2020, pp. 124-128
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Crystal structure of hyoscyamine sulfate monohydrate, (C17H24NO3)2(SO4)(H2O)
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- 03 November 2020, pp. 286-292
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Proceedings Paper
X-ray computed microtomography for the structural analysis of jewelry from the Museum “Royal Tombs of Sipán”
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- 24 August 2020, pp. S38-S42
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New Diffraction Data
Crystal structure of bisoprolol fumarate Form I, (C18H32NO4) (C4H2O4)0.5
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- 20 September 2019, pp. 34-40
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Technical Article
Crystal chemistry, X-ray diffraction reference patterns, and bandgap studies for (BaxSr1–x)2CoWO6 (x = 0.1, 0.2, 0.3, 0.5, 0.7, and 0.9)
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- 23 June 2020, pp. 197-205
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