Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 21
X-ray grazing incidence technique—corrections in residual stress measurement—a review
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- Published online by Cambridge University Press:
- 06 March 2012, pp. S11-S15
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- Cited by 21
A comparative study of Rietveld phase analysis of cement clinker using neutron, laboratory X-ray, and synchrotron data
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- Published online by Cambridge University Press:
- 01 March 2012, pp. 12-18
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- Cited by 21
Modal analysis of pyroclastic rocks by combined Rietveld and RIR methods
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- 10 January 2013, pp. 97-106
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- Cited by 21
XRPD patterns of opals: A brief review and new results from recent studies
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- 29 February 2012, pp. 274-282
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- Cited by 21
High-energy X-ray applications: current status and new opportunities
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- Published online by Cambridge University Press:
- 30 January 2018, pp. S22-S27
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- Cited by 20
New statistical calibration approach for Bruker AXS D8 Discover microdiffractometer with Hi-Star detector using GADDS software
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- 29 February 2012, pp. 263-271
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- Cited by 20
The early hydration and the set of Portland cements: In situ X-ray powder diffraction studies
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- 01 March 2012, pp. 201-208
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- Cited by 20
A rapid method for quantifying single mineral phases in heterogeneous natural dusts using X-ray diffraction
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- 29 February 2012, pp. 17-23
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- Cited by 20
X-Ray Diffraction Analysis of Titanium Carbonitride 30/70 and 70/30 Solid Solutions
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- 10 January 2013, pp. 34-35
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- Cited by 20
Quantitative X-Ray Fluorescent Analysis Using Fundamental Parameters
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- 06 March 2019, pp. 19-52
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- Cited by 20
Establishing an Instrumental Peak Profile Calibration Standard for Powder Diffraction Analyses: International Round Robin Conducted by the JCPDS-ICDD and the U.S. National Bureau of Standards†
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- Published online by Cambridge University Press:
- 10 January 2013, pp. 209-218
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- Cited by 20
X-ray Powder Diffraction Data and Structure Refinement of TeO3
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- Published online by Cambridge University Press:
- 19 May 2016, pp. 175-176
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- Cited by 20
The extent of relaxation of weld residual stresses on cutting out cross-weld test-pieces
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- 06 March 2012, pp. S31-S36
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- Cited by 20
Conversion of gamma lithium aluminate to lithium aluminum carbonate hydroxide hydrate
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- 10 January 2013, pp. 312-317
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- Cited by 20
X-ray powder diffraction analysis of a nonlinear optical material o–chlorobenzol–benzoyl thiourea
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- 10 January 2013, pp. 47-48
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- Cited by 20
Quantification of stacking disordered Si–Al layer silicates by the Rietveld method: application to exploration for high-sulphidation epithermal gold deposits
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- Published online by Cambridge University Press:
- 22 April 2015, pp. S111-S118
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- Cited by 19
Synthesis and Rietveld refinement of skutterudite-related phase CoSn1.5Te1.5
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- 29 February 2012, pp. 15-19
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- Cited by 19
In situ measurement of growth stress in alumina scale
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- 06 March 2012, pp. 69-73
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- Cited by 19
JCPDS — International Centre for Diffraction Data Task Group on Cell Parameter Refinement
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- 10 January 2013, pp. 66-76
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- Cited by 19
Doubly curved crystal (DCC) X-ray optics and applications
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- 05 March 2012, pp. 99-103
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