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Doubly curved crystal (DCC) X-ray optics and applications

Published online by Cambridge University Press:  05 March 2012

Zewu Chen  and
Walter M. Gibson
Zewu Chen
Affiliation:
X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, New York 12203
Walter M. Gibson
Affiliation:
X-Ray Optical Systems, Inc., 30 Corporate Circle, Albany, New York 12203
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Abstract

Doubly curved crystal (DCC) X-ray optics provide an enabling technology for new portable, remote, and in situ applications of monochromatic X-rays for composition and structure analysis of amorphous, polycrystalline, and crystalline solids. Femtogram sensitivity for surface contamination, parts-per-billion (ppb) impurity levels for solids, and composition, structure and uniformity of thin films with compact, low power (20–50 W) source optic combinations are possible.

Keywords

doubly curved crystalsmonochromatic X-ray opticscompact optic-source combinationsmonochromatic micro X-ray fluorescence (MMXRF)total reflection X-ray fluorescence (TXRF)X-ray reflectivity (XRR)micro X-ray diffraction (MXRD)
Type
New X-Ray Optics
Information
Powder Diffraction , Volume 17 , Issue 2 , June 2002 , pp. 99 - 103
Copyright
Copyright © Cambridge University Press 2005

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References

Berreman, D. W., Dumond, J. W. M., and Marmier, P. E. (1954). “New Point-Focusing Monochromator,” Rev. Sci. Instrum. RSINAK 25, 1219–1220. rsi, RSINAK CrossRefGoogle Scholar
Bragg, W. H. and Bragg, W. L. (1913). Proc. R. Soc. London PRLAAZ 88, 428 pln, PRLAAZ ; 89, 246.Google Scholar
Chen, Z.and Wittry, D. B. (1997). “Microprobe X-Ray Fluorescence with the use of Point-Focusing Diffractors,” Appl. Phys. Lett. APPLAB 71, 1884–1886. apl, APPLAB CrossRefGoogle Scholar
Chen, Z.and Wittry, D. B. (1998). “Microanalysis by Monochromatic Microprobe X-Ray Fluorescence-Physical Basis, Properties, and Future Prospects,” J. Appl. Phys. JAPIAU 84, 1064–1073. jap, JAPIAU CrossRefGoogle Scholar
Freund, A. (2001). “Mirrors for Synchrotron Beamlines,” Handbook of Optics, Vol. III (McGraw–Hill, New York), Chap. 26.Google Scholar
Hagg, G.and Karlsson, N. (1952). “Aluminum Monochromator with Double Curvature for High-Intensity X-Ray Powder Photographs,” Acta Crystallogr. ACCRA9 5, 728–730. acc, ACCRA9 CrossRefGoogle Scholar
Johann, H. H. (1931). Z. Phys. ZEPYAA 69, 185. zep, ZEPYAA CrossRefGoogle Scholar
Johansson, T. (1933). Z. Phys. ZEPYAA 82, 507. zep, ZEPYAA CrossRefGoogle Scholar
Siddons, P. (2001). “Crystal Monochromators and Bent Crystals,” Handbook of Optics, Vol. III (McGraw-Hill, New York), Chap. 22.Google Scholar
Takagi, S. (1962). Acta Crystallogr. ACCRA9 12, 1311. acc, ACCRA9 CrossRefGoogle Scholar
Taupin, D. (1964). Bull. Soc. Fr. Mineral. Cristallogr. BUFCAE 87, 469–511. buf, BUFCAE Google Scholar
Wittry, D. B. (1992). “Focusing X-Rays for Microprobe X- Ray Fluorescence Analysis,” Proceedings of EMSA 50th Annual Meeting, MAS 27th Annual Meeting and MSC/SMC 19th Annual Meeting (San Francisco, San Francisco), Part II, pp. 1730–1731.CrossRefGoogle Scholar
Wittry, D. B. and Golijanin, D. M. (1987). “Alignment and Characterization of Doubly-Curved X-Ray Diffractors,” Microbeam Analysis (San Francisco, San Francisco), pp. 51–55.Google Scholar
Wittry, D. B.and Sun, S. (1990a). “X-Ray Optics of Doubly Curved Diffractors,” J. Appl. Phys. JAPIAU 67, 1633–1638. jap, JAPIAU CrossRefGoogle Scholar
Wittry, D. B.and Sun, S. (1990b). “Focusing Properties of Curved X-Ray Diffractors,” J. Appl. Phys. JAPIAU 68, 387–390. jap, JAPIAU CrossRefGoogle Scholar
Wittry, D. B.and Sun, S. (1991). “Properties of Curved X- Ray Diffractors with Stepped Surfaces,” J. Appl. Phys. JAPIAU 69, 3886–3892. jap, JAPIAU CrossRefGoogle Scholar
Wittry, D. B.and Sun, S. (1992). “X-Ray Optics of Doubly Curved Diffractors—II,” J. Appl. Phys. JAPIAU 71, 564–568. jap, JAPIAU CrossRefGoogle Scholar
Wittry, D. B., Chang, W. Z., and Li, R. Y. (1992). “New Developments in Curved Diffractor Geometries for X-Ray Microanalysis,” Microbeam Anal. MIANET 2, S192–S193. mib, MIANET Google Scholar
Zachariasen, W. H. (1967). Theory of X-Ray Diffraction in Crystals (Dover, New York).CrossRefGoogle Scholar