Microscopy and Microanalysis: Volume 28 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 28 - April 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Atomic Structure of Hierarchical Few-Unit-Cell MFI Zeolites

Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control

Characterising and Minimising Damage Effects in Air- and Beam-sensitive Solid-state Li-ion Battery Materials

Digital Image Processing in C++ in SEM Images

Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology

Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy

Investigating Sweet Spot Imaging of Perovskite Catalysts Bearing Exsolved Active Nanoparticles

Optimized Ultra-Fast Low Dose Electron Detection

Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis

Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy

Resolving Electrode-Electrolyte Interfaces in Batteries with Low Dose Cryogenic Transmission Electron Microscopy

The Importance of the σ-hole in the Self-Assembly of Halogenated Polypeptoids

Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells

Advances in Beam-sensitive Sample Preparation and Observation

Latency Dose Formation In DMC By Inelastic Electron Scattering

How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM

Machine-Learning Assisted Exit-wave Reconstruction for Quantitative Feature Extraction

Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions

3D Atom Dynamics in Pt-NiO Nanocrystals

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 28 - April 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions