Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Atomic Structure of Hierarchical Few-Unit-Cell MFI Zeolites

Atomic-scale Fabrication of 1D-2D Nano Hetero-structures within 2D Materials through Automated Tracking and Electron Beam Control

Characterising and Minimising Damage Effects in Air- and Beam-sensitive Solid-state Li-ion Battery Materials

Digital Image Processing in C++ in SEM Images

Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology

Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy

Investigating Sweet Spot Imaging of Perovskite Catalysts Bearing Exsolved Active Nanoparticles

Optimized Ultra-Fast Low Dose Electron Detection

Ways to Suppress Electron Beam Damage Using High-Speed Electron Beam Control by Electrostatic Shutter in Sample Observation and Analysis

Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy

Resolving Electrode-Electrolyte Interfaces in Batteries with Low Dose Cryogenic Transmission Electron Microscopy

The Importance of the σ-hole in the Self-Assembly of Halogenated Polypeptoids

Overcoming Artifacts in Imaging Nanometer-thick Ionomer Layers in Anion Exchange Membrane Fuel Cells

Advances in Beam-sensitive Sample Preparation and Observation

Latency Dose Formation In DMC By Inelastic Electron Scattering

How Low Can You Go: Pushing the Limits of Dose and Frame-time in the STEM

Machine-Learning Assisted Exit-wave Reconstruction for Quantitative Feature Extraction

Electron Counted STEM-EELS Spectroscopy Optimized for low kV (< 80 kV) via Hybrid Pixel Detection

Electrostatic Switching for Spatiotemporal Dose Control in a Transmission Electron Microscope

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions

3D Atom Dynamics in Pt-NiO Nanocrystals

Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions