Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-25T13:04:39.935Z Has data issue: false hasContentIssue false

Digital Image Processing in C++ in SEM Images

Published online by Cambridge University Press:  22 July 2022

Luis Esteban Ramirez Peña*
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Hector A. Calderon
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Alin Andrai Carsteanu
Affiliation:
Instituto Politécnico Nacional, Departamento de Matematicas, ESFM, Zacatenco CDMX, Mexico
*
*Corresponding author: [email protected]

Abstract

Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Copyright
Copyright © Microscopy Society of America 2022

Reference

References

Goldstein, JI et al. in “Scanning electron microscopy and X-ray microanalysis”, (Plenum Press, New York), p 673.Google Scholar
Paragual-Delgado, F. Mundo nano [online] 13(25) (2020), p.101. Epub 25-Nov-2020. ISSN 2448-5691. https://doi.org/10.22201/ceiich.24485691e.2020.25.69626.Google Scholar
Domínguez, S, Revista Iberoamericana de Automática e Informática Industrial RIAI 12(1) (2015), p. 69, ISSN 1697-7912, https://doi.org/10.1016/j.riai.2014.11.006.CrossRefGoogle Scholar