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Digital Image Processing in C++ in SEM Images

Published online by Cambridge University Press:  22 July 2022

Luis Esteban Ramirez Peña*
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Hector A. Calderon
Affiliation:
Instituto Politécnico Nacional, Departamento de Física, ESFM, Zacatenco CDMX, Mexico
Alin Andrai Carsteanu
Affiliation:
Instituto Politécnico Nacional, Departamento de Matematicas, ESFM, Zacatenco CDMX, Mexico
*
*Corresponding author: [email protected]

Abstract

Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Copyright
Copyright © Microscopy Society of America 2022

Reference

References

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