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Electron Backscatter Diffraction Analysis of Beam Sensitive Samples Using Direct Detection Technology

Published online by Cambridge University Press:  22 July 2022

Matthew M Nowell  and
René de Kloe
Matthew M Nowell
Affiliation:
EDAX LLC., Pleasanton, CA USA
René de Kloe
Affiliation:
EDAX B.V., Tilburg, The Netherlands

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2190 - 2191
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Copyright
Copyright © Microscopy Society of America 2022

References

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Adhyaksa, G et al. , Advanced Materials 30 (2018), p. 1804792.CrossRefGoogle Scholar