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Formation of Defects in MoS2 during Data Acquisition of High-resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Cuauhtémoc Nuñez Valencia ,
Matthew Helmi Leth Larsen ,
William Bang Lomholdt ,
Daniel Kelly ,
Jakob Schiøtz  and
Thomas Willum Hansen
Cuauhtémoc Nuñez Valencia*
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Matthew Helmi Leth Larsen
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
William Bang Lomholdt
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Jakob Schiøtz
Affiliation:
DTU Physics, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
Thomas Willum Hansen
Affiliation:
DTU Nanolab, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2192 - 2193
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Copyright
Copyright © Microscopy Society of America 2022

References

Kretschmer, S., et al. , Nano Letters, 20 (2020), p. 2865-2870. doi:10.1021/acs.nanolett.0c00670CrossRefGoogle Scholar
Susi, T., Meyer, J. C., and Kotakoski, J., Nature Reviews Physics, 1 (2019), p. 397-405. doi: 10.1038/s42254-019-0058-yCrossRefGoogle Scholar
Egerton, R. F., Li, P., and Malac, M. Micron, 35 (2004), p. 399-409. doi: 10.1016/j.micron.2004.02.003CrossRefGoogle Scholar