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Advances in Beam-sensitive Sample Preparation and Observation

Published online by Cambridge University Press:  22 July 2022

Pawel Nowakowski*
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Cecile Bonifacio
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Mary Ray
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
Paul Fischione
Affiliation:
E.A. Fischione Instruments, Inc., Export, PA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Copyright
Copyright © Microscopy Society of America 2022

References

Shi, J, Yang, Y, Shao, H, Journal of Membrane Science 547 (2018), p. 1-10. doi:10.1016/j.memsci.2017.10.033Google Scholar
Donga, H, Xiao, X, Jin, Ch, Wang, X, Tang, P, Wang, Ch, Yin, Y, Wang, D, Yang, S, Wud, Ch, Journal of Power Sources 423 (2019), p. 72-79. doi:10.1016/j.jpowsour.2019.03.032Google Scholar
Zhang, Y, Zuo, T-T, Popovic, J., Lim, K, Yin, Y-X, Maier, J, Guo, Y-G, Materials Today 33 (2020), p. 56-74. doi:10.1016/j.mattod.2019.09.018CrossRefGoogle Scholar