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Analysis of Complex, Beam-Sensitive Systems by Electron Microscopy

Published online by Cambridge University Press:  22 July 2022

Martha Ilett ,
Helen Freeman ,
Zabeada Aslam ,
Maryam Afzali ,
Joanna Galloway ,
Fiona Meldrum  and
Rik Brydson
Martha Ilett
Affiliation:
School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Helen Freeman
Affiliation:
School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Zabeada Aslam
Affiliation:
School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Maryam Afzali
Affiliation:
School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
Joanna Galloway
Affiliation:
School of Chemistry, University of Leeds, Leeds LS2 9JT, UK
Fiona Meldrum
Affiliation:
School of Chemistry, University of Leeds, Leeds LS2 9JT, UK
Rik Brydson*
Affiliation:
School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, UK
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2202
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Copyright
Copyright © Microscopy Society of America 2022

References

Ilett, M., et al. , Phil. Trans. R. Soc. A 378: 20190601 (2020). doi:10.1098/rsta.2019.0601.Google Scholar
Ilett, M. et al. , J. Microscopy 2022, accepted.Google Scholar