Microscopy and Microanalysis: Volume 28 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 28 - April 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science

Correlative Microscopy Reveals Air-Stable 2D Gallium-Intercalated Monolayer Epitaxial Graphene

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

A Novel Pathway for Multi-scale High-resolution Time-resolved Residual Stress Evaluation of Laser-welded Eurofer97

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Probing Atom Dynamics in Excited Nanocrystals

Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts

Low Dose Methods for Atomic-scale Transmission Electron Microscopy of Cs1-xFAxPbI3 Quantum Dots: Structure, Defects, and Performance

Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data

Spatial Distribution of the Electron Dose and the Effects on Beam Damage in STEM

AXON Dose: A Machine Vision Solution for Accurate, Quantifiable Dose Management in the Transmission Electron Microscope

Development of an Organic Controlled Environment Vitrification System to Expand Cryo-Protection of Beam Sensitive Materials

Electron Microscopy Characterization of Gold Nanoparticles Supported on an Ordered TiO2 Nanowires Array.

Exploring Electron Energy-Loss Spectroscopy for Characterization of Structured Fluids

Interpretability of Low-Dose HRTEM Images of Supported Metal Nanoparticles

Spatial Differentiation of Aluminium Siting by the Single-Atom Adsorption Sites in Zeolite by Electron Microscopy

STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

Combining Spatial and Temporal Resolution in Cryo-TEM of Device Materials

Studying Electronic Structure in Two-Dimensional Functionalized Organic-Metallic MXenes with Cryo-STEM

Understanding Structural and Chemical Modifications of ZIF MOF Under Electron-Beam Irradiation using STEM-EELS

Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks

Comparing Structural and Functional Changes of Biomolecules under Electron Irradiation with Liquid Cell Transmission Electron Microscopy

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 28 - April 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions