Microscopy and Microanalysis: Volume 28 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Correlative Multimodal Microscopy Using AFM-in-SEM in Material Science

Correlative Microscopy Reveals Air-Stable 2D Gallium-Intercalated Monolayer Epitaxial Graphene

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

A Novel Pathway for Multi-scale High-resolution Time-resolved Residual Stress Evaluation of Laser-welded Eurofer97

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions

Probing Atom Dynamics in Excited Nanocrystals

Optimizing STEM Imaging Conditions Towards Reliable Representation of Single Atom Catalysts

Low Dose Methods for Atomic-scale Transmission Electron Microscopy of Cs1-xFAxPbI3 Quantum Dots: Structure, Defects, and Performance

Sparsity and Noise Effects on the Reconstruction of Subsampled Scanning Transmission Electron Microscopy Data

Spatial Distribution of the Electron Dose and the Effects on Beam Damage in STEM

AXON Dose: A Machine Vision Solution for Accurate, Quantifiable Dose Management in the Transmission Electron Microscope

Development of an Organic Controlled Environment Vitrification System to Expand Cryo-Protection of Beam Sensitive Materials

Electron Microscopy Characterization of Gold Nanoparticles Supported on an Ordered TiO2 Nanowires Array.

Exploring Electron Energy-Loss Spectroscopy for Characterization of Structured Fluids

Interpretability of Low-Dose HRTEM Images of Supported Metal Nanoparticles

Spatial Differentiation of Aluminium Siting by the Single-Atom Adsorption Sites in Zeolite by Electron Microscopy

STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

Combining Spatial and Temporal Resolution in Cryo-TEM of Device Materials

Studying Electronic Structure in Two-Dimensional Functionalized Organic-Metallic MXenes with Cryo-STEM

Understanding Structural and Chemical Modifications of ZIF MOF Under Electron-Beam Irradiation using STEM-EELS

Electron Beam Damage Mechanisms in Solution Phase Electron Microscopy of Metal-Organic Frameworks

Comparing Structural and Functional Changes of Biomolecules under Electron Irradiation with Liquid Cell Transmission Electron Microscopy

Microscopy and Microanalysis

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Volume 28 - April 2022

Physical Sciences Symposia

Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

On Demand - Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments

Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions