Microscopy and Microanalysis: Volume 23 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract

Differential Phase Contrast Imaging with Reduced Dynamical Diffraction Effect

The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques

Methodology to Improve Strain Measurement in III-V Semiconductors Materials

Phase and Atomic Displacement Profiles within Crystals Measured and Simulated using the Self-interference of Split HOLZ Lines

How to Avoid Artifacts in Nanobeam Diffraction Strain Measurements

Strain Measurement of 3D Structured Nanodevices by EBSD

Electrostatic Potential Mapping by Secondary-electron Voltage-contrast and Electron-beam-induced-current in TEM

EBIC-Enabled NanoManipulators - Investigating Dislocations in mc-Solar Cells

STEM EBIC Mapping of the Metal-Insulator Transition in Thin-film NbO2

Imaging of Electric Fields at the GaN/Ni Interface Using Electron Beam Induced Current in a Scanning Transmission Electron Microscope

In Situ Nanoprobing Tools for Fault Localization and Defect Characterization

Epitaxial Growth of ZnO Monolayer on Graphene: The Thinnest Metal Oxide Semiconductor

Strain Coupling During Lithiation of a Fe3O4/SrTiO3 Epitaxial Thin Film

Directly Identifying Phase Segregation in 2D Quaternary Alloys

Cross-sectional STEM Imaging and Spectroscopy of Devices with Embedded 2D Materials

Dielectric breakdown along c-axis boundaries in magnetoelectric O2O3 for spintronic devices

Structure and Chemistry of Oxide Surface Reconstructions in III-Nitrides Observed using STEM EELS

Field Emission from Zinc Oxide Nanobelt

High Spatial Resolution Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography study of Indium segregation in N-polar InGaN Quantum Wells

Detailed In Situ Observations of Electromigration in Aluminum Wires

Microscopy and Microanalysis

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Volume 23 - October 2017

Physical Science Symposia

Characterization of Semiconductor Materials and Devices

Abstract