Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-26T17:44:12.105Z Has data issue: false hasContentIssue false
  • English
  • Français

Dielectric breakdown along c-axis boundaries in magnetoelectric O2O3 for spintronic devices

Published online by Cambridge University Press:  04 August 2017

Congli Sun ,
Zhewen Song ,
Michael Street ,
William Echtenkamp ,
Jie Feng ,
Christian Binek ,
Dane Morgan  and
Paul M. Voyles
Congli Sun
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Zhewen Song
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Michael Street
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, Nebraska 68588, USA
William Echtenkamp
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, Nebraska 68588, USA
Jie Feng
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Christian Binek
Affiliation:
Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience, University of Nebraska, Lincoln, Nebraska 68588, USA
Dane Morgan
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, 53706, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1442 - 1443
Copyright
© Microscopy Society of America 2017 

References

[1] He, X., Wang, Y., Wu, N., et al, Nat. Mater 9 2010 579–585.CrossRefGoogle Scholar
[2] Ashida, T., Oida, M., Shimomura, N., et.al, Appl. Phys. Lett 106 2015 132407.CrossRefGoogle Scholar
[3] Mosk, A., Muller, D. A., Nakagawa, N., et.al, Nature 430 2004 657.Google Scholar
[4] This work was supported in part by C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar