Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-26T17:22:37.335Z Has data issue: false hasContentIssue false
  • English
  • Français

The Measurement of Strain, Chemistry and Electric Fields by STEM based Techniques

Published online by Cambridge University Press:  04 August 2017

J.-L. Rouviere ,
B. Haas ,
E. Robin ,
D. Cooper ,
N. Bernier  and
M. Williamson
J.-L. Rouviere
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
B. Haas
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
E. Robin
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, INAC/MEM/LEMMA, 17 rue des Martyrs, 38054 Grenoble, France.
D. Cooper
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble, France
N. Bernier
Affiliation:
University Grenoble Alpes, 38000 Grenoble, France CEA, LETI, MINATEC Campus, 17 rue des Martyrs, 38054 Grenoble, France
M. Williamson
Affiliation:
Thermo Fisher Scientific (formerly FEI Company), Eindhoven, Netherlands

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1414 - 1415
Copyright
© Microscopy Society of America 2017 

References

[1] Rouviere, J.L., et al. FCMN conference proceeding (2015) p. 38 (available at www.nist.gov).Google Scholar
[2] Cooper, D., et al., Micron 80, 145 2016.Google Scholar
[3] Robin, E. US patent 2016 0169668, A1.Google Scholar
[4] Rueda-Fonseca, P., Robin, E., et al., Nano Lett. 16, 1637 2016). p. 1637.Google Scholar
[5] Haas, B., et al EMC conf. proc, Lyon 28 August - 2 September, (2016).Google Scholar