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Cross-sectional STEM Imaging and Spectroscopy of Devices with Embedded 2D Materials

Published online by Cambridge University Press:  04 August 2017

Ryan J. Wu ,
Danielle Reifsnyder Hickey  and
K. Andre Mkhoyan
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA
Danielle Reifsnyder Hickey
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, MN, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1440 - 1441
Copyright
© Microscopy Society of America 2017 

References

[1] Chhowalla, M., Jena, D. & Zhang, H. Nature Reviews: Materials 1 2016 16052.Google Scholar
[2] Han, W., et al, Nature Nanotechnology 9 2014). p. 704.Google Scholar
[3] Qian, X., et al, 2D Materials 2 2015 2003.Google Scholar
[4] Wang, H., et al, Physical Review Letters 117 2016 076601.Google Scholar
[5] Lee, J.S., et al, Physical Review B 92 2015 155312.Google Scholar
[6] The authors gratefully acknowledge funding provided by C-SPIN, one of six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA.Google Scholar