Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving

Evaluation of High-Resolution STEM Imaging Advancement Under Gas-Environment with Open Window MEMS Holder and Gas Injection System

Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Controlled Environments from Sample Preparation to Electron Microscopy Characterization

Flight Readiness of Mochii S: Portable Spectroscopic Scanning Electron Microscope Facility on the International Space Station (ISS)

Routine Microscopy in Quantum Dot Industry

Quantitative Nanomechanical Property Mapping and in situ SPM Imaging of Polyetherimide Nanocomposites

Quantifying the Dispersion of Nanoparticles by Electron Microscopy

Quantification and Precision in Particle Analysis Using SEM and EDS

TEM Investigation on the Relationship Between Catalytic Activity and Structure in Rh/Al2O3 Catalysts

Understanding the Composition of Dispersed Phases in Silicon-Rich Metal-Silicon Alloys by Parsing SEM/EDS Hyperspectral Images

Transforming Samples into Data – Experimental Design and Sample Preparation for Electron Microscopy

Microscopy on Drugs: Characterization and Quantification of Pt-based Pharmaceuticals using the STEM.

Microscopic Evaluation of Fungal Cleaning Protocols for Aircraft Coatings

Microscopy Techniques for Characterization of Hydration in Dairy Powders

Scanning Electron Microscopy for Fabrication and Imaging of Hydrogel Composites

Failure Analysis of Trace Elements and Surfaces Using Hitachi Dedicated STEM

A Simple Method to Decouple Redeposition-Related Artifacts from Real Defects in the Failure Analysis of Silicon Photonics Modules

Failure Analysis of Polyethylene Products Using Microscopy

Radiation Damage on Liquid Electrolyte during Spatially Resolved Soft X-ray Photoemission Measurements

Structural Assessment of (Sub-)Monolayer Coatings in Device Processing at High Spatial Resolving Power by TOF-SIMS Tandem MS Imaging

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Microscopy and Microanalysis for Real-World Problem Solving