Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science

Exploration of TATB Grain Structure on Detonation Sensitivity Using X-ray CT

What Lies Beneath: 3D vs 2D Correlative Imaging Challenges and How to Overcome Them

A Correlative and Multi-Modal Approach to Analyzing Microscopic Particulate Contaminants in Carbon Black

Bubbles in the Bullion: Micro-CT Imaging of the Internal Structure of Ancient Coins

Structural Analysis of Liquid Metal Catalysts in Porous Silica Utilizing Nano-CT and Analytical Transmission Electron Microscopy

The Dynamics of Abnormal Grain Growth in a Particle-Containing System: Integration of 3D Experimental Data into a Capillarity Driven Model

Quantifying the 3D Distribution of Pd Nanocatalysts Supported on Mesoporous Carbon for Furfural Hydrogenation

Correlated Analyses of Corroded Aluminum Alloy with a New SPM and FIB-SEM Linkage System

Correlative Probe and Electron Microscopy CPEM™ – The Novel Technology for 3D Material Surface Analysis

Three-Dimensional (3D) Analysis of Inclusions in Structural Alloys with Automated Serial Sectioning

Structural and Elemental Three-Dimensional Analysis of Dentin Occlusion

Beyond Volumes: Extraction of Non-Manifold Topologies from 3D Microscopy Data

Microstructures and Properties of As-Cast Al2.7CrFeMnV, Al2.7CrFeTiV, and Al2.7CrMnTiV High Entropy Alloys

Application of Missing Wedge Inpainting in Material Science

Low Voltage, Low Energy Electron Microscopy Imaging and Analysis

Ultra Low Voltage Reflected Electron Energy Loss Spectroscopy

Surface imaging with UHV SLEEM and SEM LEEM

Using the EDS Clues: Peak Fitting Residual Spectrum and Analytical Total

Imaging Li–Ion Battery Material with Low Voltage Backscattered Electrons – comparison of a Field Emission SEM Crossbeam540/Merlin with the DELTA SEM

Low Energy Nano Diffraction (LEND) – Bringing true Diffraction to SEM

Influence of Electron Beam Energy and Dose on In Situ Electron Microscopy Studies for Direct Correlation between Structure and Properties

Microscopy and Microanalysis

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Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Leveraging 3D Imaging and Analysis Methods for New Opportunities in Material Science

Low Voltage, Low Energy Electron Microscopy Imaging and Analysis