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Mechanical Precision Preparation of Atom Probe Tips

Published online by Cambridge University Press:  05 August 2019

Andrea Bachmaier ,
Georg B. Rathmayr  and
Peter Felfer
Andrea Bachmaier*
Affiliation:
Erich Schmid Institute of Materials Science, 8700 Leoben, Austria
Georg B. Rathmayr
Affiliation:
microsample, 4644 Scharnstein, Austria
Peter Felfer
Affiliation:
Department of Materials Science, Institute I, FAU Erlangen-Nürnberg, 91058 Erlangen, Germany
*
*Corresponding author: [email protected]

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 320 - 321
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Rathmayr, GB, Bachmaier, A and Pippan, R, Journal of Testing and Evaluation 41 (2013), pp.635-646.Google Scholar
[2]Gomer, R, Field Emission and Field Ionization (Cambridge, Harvard University Press).Google Scholar
[3]Takahashi, J et al. , Ultramicroscopy 107(9) (2007) pp.744-749.Google Scholar
[4]Russell, KF et al. , Ultramicroscopy 107(9) (2007), pp. 750-755.Google Scholar
[5]A. Bachmaier acknowledges the financial support by the Austrian Science Fund (FWF): I2294-N36.Google Scholar