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Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography

Published online by Cambridge University Press:  05 August 2019

Fengshan Zheng ,
Vadim Migunov ,
Jan Caron ,
Hongchu Du ,
Giulio Pozzi  and
Rafal E Dunin-Borkowski
Fengshan Zheng
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Vadim Migunov
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany
Jan Caron
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany
Hongchu Du
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany
Giulio Pozzi
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany Department of Physics and Astronomy, University of Bologna, Viale Berti Pichat 6/2, 40127 Bologna, Italy
Rafal E Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, 52425 Jülich, Germany

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 326 - 327
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).Google Scholar