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Spatially Resolved Soft X-ray Spectroscopy in Scanning X-ray Microscopes

Published online by Cambridge University Press:  05 August 2019

Adam P. Hitchcock*
Affiliation:
Chemistry & Chemical Biology, McMaster University, Hamilton, ON, Canada.
Peter Krüger
Affiliation:
Graduate School of Science and Engineering, Chiba University, Chiba, Japan.
Carla Bittencourt
Affiliation:
Chemistry, University of Mons, Mons, Belgium.
George D.W. Swerhone
Affiliation:
Environment and Climate Change Canada, Saskatoon, SK, Canada.
John R. Lawrence
Affiliation:
Environment and Climate Change Canada, Saskatoon, SK, Canada.
*
*Corresponding author: [email protected]

Abstract

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Type
Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hitchcock, AP in “Handbook on Nanoscopy” eds. Van Tendeloo, G., Van Dyck, D. and Pennycook, S. J. (Wiley).Google Scholar
[2]Zhu, XH et al. , Proc. Nat. Acad. Sci. 113 (2016), p. E8219.Google Scholar
[3]Yu, Y et al. , Nature Communications 9 (2018), p. 921.Google Scholar
[4]Hitchcock, AP et al. , Env. Sci. Tech. 46 (2012), p. 2821.Google Scholar
[5]Krüger, P et al. , Rad. Phys. & Chem (2019) in press. doi: 10.1016/j.radphyschem.2019.01.014Google Scholar
[6]Lawrence, JR et al. , J. Microscopy 261 (2016), p. 130.Google Scholar
[7]Hitchcock, A.P. et al. , Geobiology 7 (2009), p. 432.Google Scholar
[8]Research performed using the ambient-STXM on beamline 10ID1 at the Canadian Light Source, which is supported by the Canada Foundation for Innovation.Google Scholar