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Ultrafast SEM

Published online by Cambridge University Press:  05 August 2019

Petr Hlavenka ,
Erik Kieft  and
Ernst Jan Vesseur
Petr Hlavenka*
Affiliation:
Thermo Fisher Scientific, Brno, Czech Republic.
Erik Kieft
Affiliation:
Thermo Fisher Scientific, Eindhoven, the Netherlands.
Ernst Jan Vesseur
Affiliation:
Thermo Fisher Scientific, Eindhoven, the Netherlands.
*
*Corresponding author: [email protected]

Abstract

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Type
Low-Energy X-Ray Analysis: Novel Applications Using Soft X-Ray Emission Spectroscopy (SXES), Cathodoluminescence (CL), and Synchrotron Techniques
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 268 - 269
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Meuret, S et al. , Ultramicroscopy 197 (2019), p. 28.Google Scholar
[2]Gesley, M, Review of Scientific Instruments 64 (1993), p. 3169.Google Scholar
[3]Yang, D, Mohammed, OF and Zewail, AH, PNAS 107 (2010), 14993.Google Scholar
[4]The authors acknowledge funding from Technology Agency of the Czech Republic, TE01020118.Google Scholar